Analysis of angle resolved x-ray photoelectron emission spectra of highly oriented pyrolytic graphite

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Resumo

The interest in Van-der-Waals structures is associated with their unique physical and chemical properties and the prospects for technological applications. In this work, the object of study is highly oriented pyrolytic graphite as a model of such materials. The experimental results of measuring the spectra of angle resolved X-ray photoelectron spectroscopy are presented. The experiments were performed for detection angles of 0°, 60°, 80° and 85° from the surface normal, which made it possible to maximally localize the XPS signal generated by the upper layer of the highly oriented pyrolytic graphite. A technique for reconstructing the differential cross section of inelastic electron energy losses from experimental X-ray photoelectron spectroscopy spectra is presented. According to this technique, the differential cross section of inelastic electron scattering in the highly oriented pyrolytic graphite was reconstructed for each detection angle. The obtained cross sections are compared with those reconstructed for graphene with a different number of layers. The determining influence of collective plasmon electron energy losses on the formation of the energy loss spectrum in heterogeneous Van der Waals structures is indicated.

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Sobre autores

V. Afanas′ev

National Research University “MPEI”

Autor responsável pela correspondência
Email: v.af@mail.ru
Rússia, Moscow

L. Lobanova

National Research University “MPEI”

Email: v.af@mail.ru
Rússia, Moscow

A. Eletskii

National Research University “MPEI”

Email: v.af@mail.ru
Rússia, Moscow

K. Maslakov

Lomonosov Moscow State University

Email: v.af@mail.ru
Rússia, Moscow

М. Semenov-Shefov

National Research University “MPEI”

Email: v.af@mail.ru
Rússia, Moscow

G. Bocharov

National Research University “MPEI”

Email: v.af@mail.ru
Rússia, Moscow

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2. Рис. 1. Энергетические спектры характерных потерь энергии электронов, измеренные при прохождении электронов с энергией 100 кэВ через однослойный (1), двухслойный (2), пятислойный (3), десятислойный (4) графен [10].

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3. Рис. 2. Обзорный спектр RFES высокоориентированного пиролитического графита.

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4. Рис. 3. Экспериментальный спектр RFES в области пика углерода 1s высокоориентированного пиролитического графита при углах детектирования фотоэлектронов 0° (4), 60° (3), 80° (2) и 85° (1) относительно оси с структуры графита.

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5. Рис. 4. Дифференциальные сечения неупругого рассеяния электронов, восстановленные из экспериментальных данных [10] по методу (2) для однослойного (1), двухслойного (2), пятислойного (3) и десятислойного графена (4).

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6. Рис. 5. Дифференциальные сечения неупругого рассеяния электронов в высокоориентированном пиролитическом графите при углах регистрации фотоэлектронов 0° (4), 60° (3), 80° (2) и 85° (1), измеренные от нормали к плоскостям графена.

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