THE X-RAY PHOTOELECTRON SPECTROSCOPY IN THE ATMOSPHERE OF HIGHLY PURE NOBLE GASES

Мұқаба

Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Рұқсат ақылы немесе тек жазылушылар үшін

Аннотация

A variant of the X-ray photoelectron spectroscopy method is disclosed. To clean the surface of the sample under study, the spectrum is recorded under continuously ventilation the working chamber of spectrometer with installed sample with a extra-pure noble gas at 10–3–10–1 Pa. It is shown that the proposed approach allows to obtain representative spectra of the sample surface free of adsorbed particles, contaminants and impurities without using ultra-high vacuum technology and without destructive effects on the sample surface. The proposed approach ensures a relatively quick preparation of the device for operation, as well as the possibility of studying samples that are destroyed under ultra-high vacuum conditions (crystal hydrates, organic compounds) and under the influence of hard methods of surface cleaning, such as mechanical cleaning, significant heating or ion etching.

Авторлар туралы

A. Lipanov

Federal Research Center M. V. Keldysh Institute of Applied Mathematics of the Russian Academy of Sciences; Udmurt Federal Research Center of the Ural Branch of the Russian Academy of Sciences

125047 Moscow, Russian Federation; 426067 Izhevsk, Russia

M. Alies

Udmurt Federal Research Center of the Ural Branch of the Russian Academy of Sciences

426067 Izhevsk, Russia

E. Shelkovnikov

Udmurt Federal Research Center of the Ural Branch of the Russian Academy of Sciences

Email: evshelk@udman.ru
426067 Izhevsk, Russia

N. Isupov

Udmurt Federal Research Center of the Ural Branch of the Russian Academy of Sciences

426067 Izhevsk, Russia

N. Lomova

Udmurt Federal Research Center of the Ural Branch of the Russian Academy of Sciences

426067 Izhevsk, Russia

F. Chausov

Udmurt Federal Research Center of the Ural Branch of the Russian Academy of Sciences

426067 Izhevsk, Russia

Әдебиет тізімі

  1. Зигбан К., Нордлинг К., Фальман А. и др. Электронная спектроскопия. М.: Мир, 1971. 493 с.
  2. Анализ поверхности методами Оже- и рентгеновской фотоэлектронной спектроскопии. Бриггс Д., Сих М.П. (ред.). М.: Мир, 1987. 600 с.
  3. Широбоков С.В., Русских Е.В., Исупов Н.Ю. Способ экспресс-анализа твердотельных образцов на фотоэлектронных спектрометрах. Патент РФ 2295170. 2007.
  4. Trapeznikov V.A., Shabanova I.N., Kholzakov A.V., Ponomaryov A.G. // J. Elec. Spec. Rel. Phenom. 2004. V. 137–140. P. 383–385. https://doi.org/10.1016/j.elspec.2004.02.115
  5. Shirley D.A. // Phys. Rev. 1972. V. 5. P. 4709–4714. https://doi.org/10.1103/PhysRevB.5.4709
  6. Wojdyr M. // J. Appl. Cryst. 2010. V. 43. P. 1126–1128. https://doi.org/10.1107/S0021889810030499
  7. Moulder J.F., Stickle W.F., Sobol P.E., Bomben K.D. Handbook of X-ray photoelectron spectroscopy. Chastain J. (ed.). Eden Prairie: Perkin-Elmer Corporation, 1992. 261 p.
  8. Grosvenor A.P., Kobe B.A., Biesinger M.C., McIntyre N.S. // Surf. Interf. Anal. 2004. V. 36. P. 1564–1574. https://doi.org/10.1002/sia.1984
  9. Biesinger M.C. // Surf. Interf. Anal. 2017. V. 49. P. 1325–1334. https://doi.org/10.1002/sia.6239

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML
Жүктеу

© Russian Academy of Sciences, 2025